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作者(中文):吳裕翔
作者(外文):Wu, Yu Hsiang
論文名稱(中文):光束平坦化裝置用於大面積雷射干涉微影系統之研究
論文名稱(外文):Application of Laser Beam Shaping Device on Large Area Laser Interference Lithography System
指導教授(中文):傅建中
指導教授(外文):Fu, Chien Chung
口試委員(中文):楊尚達
顧逸霞
口試委員(外文):Yang, Shang Da
Ku, Yi Sha
學位類別:碩士
校院名稱:國立清華大學
系所名稱:奈米工程與微系統研究所
學號:102035507
出版年(民國):104
畢業學年度:103
語文別:中文
論文頁數:41
中文關鍵詞:雷射干涉微影均勻度光束整形高斯分布平頂分布薄膜干涉
外文關鍵詞:Laser interference lithography、UniformityBeam shapingGaussian distributionFlat top distributionThin film interference
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近年來,隨著奈米科技的蓬勃發展,許多奈米結構的製作方法也相繼被發明出來,如黃光微影、電子束微影、奈米壓印、雷射干涉微影等。其中雷射干涉微影(Laser Interference Lithography)是由兩道以上的雷射光相互重疊以形成干涉,並以光敏感材料紀錄所形成的干涉圖形以產生相對應的週期性奈米結構。在製作週期性奈米結構上,相較於其他方法,雷射干涉微影可以進行較大面積的曝光,同時具有無光罩、高產能等優勢,因此在許多相關應用上,如光柵、光子晶體等,雷射干涉微影有著相當高的發展潛力。
然而一般雷射的輸出強度呈現高斯分布,將雷射光束擴大進行大面積曝光的時候,光束中心的光強度會遠高於光束邊緣的強度,造成相同的曝光時間內,整片曝光基板的結構均勻度較差,甚至導致中央部分的過曝或是基板邊緣曝光不足的現象。本研究的目的是設計一光束平坦化裝置,可以使原本強度呈高斯分布的雷射光,在擴束並通過本裝置後,形成能量均勻分布之平頂光束,並用於雷射干涉微影以達到較佳的曝光效果。
Recently, with the rapid development of nanotechnology, many methods of making nanostructure are also invented, such as photolithography, electron beam lithography, nanoimprint lithography, laser interference lithography. Among these methods, laser interference lithography overlap two or more than two laser beams to form interference pattern, and then use light sensitive material to record the pattern in order to make periodic nanostructures. Compare to other methods, laser interference lithography is more convenient to do large area exposure, and also with advantage of high production capability and no need of mask. Due to these advantages, laser interference lithography has a rather high development potential in some related application like optical grating and photonic crystal fabrication.
However, the output intensity distribution of normal laser has a Gaussian distribution, when we expand the laser beam to do a large area exposure, the light intensity at the center part of laser beam will be much higher than the intensity of the edge area. This will lead to a bad uniformity of the structure, and even cause an overexposure at the center or underexposure on the edge. In this research, we are going to design a laser beam flattening device. When a laser beam is expanded and pass through this device, the intensity distribution of laser beam will change from Gaussian distribution to a flat top distribution. This flat top laser beam can be used to reach a better quality of exposure in laser interference lithography.
中文摘要
Abstract
目錄
圖目錄
第一章 緒論
1.1 雷射干涉微影
1.2 光束平坦化與文獻回顧
1.3 研究動機與目的
第二章 研究方法
2.1 光的干涉特性
2.2 光束整形的原理
2.3 薄膜干涉原理
2.4 光束整形裝置的設計與架構
第三章 實驗結果與討論
3.1 利用Power meter測量光形在空間上的分布
3.2 利用Beam profiler測量光形在空間上的分布
3.3 光束平坦化裝置對曝光結構均勻度的影響
3.4 使用光束平坦化裝置後的產能比較
第四章 結論
第五章 未來工作
第六章 參考文獻
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