|
[1] Jiang, T., Chen, B., He, X. and Stuart, P., “Application of steady-state detection method based on wavelet transform”, Computers and Chemical Engineering, Vol. 27, 2003, pp. 569-578. [2] Aguado, D., Ferrer, A., Seco, A. and Ferrer, J., “Using unfold-PCA for batch-to-batch start-up process understanding and steady-state identification in a sequencing batch reactor”, J. Chemom, Vol. 22, 2008, pp. 81–90. [3] Nomikos, P., MacGregor, J., “Monitoring batch processes using multiway principal component analysis”, AIChE Journal, Vol. 40, 1994, pp. 1361-1375. [4] Yao, Y., Zhao, C. and Gao, F., “Batch-to-Batch steady state identification based on variable correlation and Mahalanobis distance”, Industrial Engineering Chemistry Research, Vol. 48, No. 24, 2009, pp. 11060-11070. [5] Mardia, K., Kent, J., Bibby, J., MultiVariate Analysis; Academic Press: New York, 1979. [6] Von Neumann, J., “Distribution of the ratio of the mean square successive difference to the variance”, Ann. Math. Stat., 1941, pp. 367–395. [7] Szela, J. T., and Rhinehart, R. R., “A virtual employee to trigger experimental conditions”, Journal of Process Analytical Chemistry, Vol. 8, No. 1, 2003. [8] Huang, N. E. and Wu, Z., “Ensemble empirical mode decomposition: a noise assisted data analysis method”, Center for Ocean-Land-Atmosphere Studies, Technical Report series, Vol. 193, No. 173. 2005. [9] Li-aung Y., “Realtime empirical mode decomposition for intravascular bubble detection”, School of Engineering and Physical Sciences, 2010. [10] Huang NE., “Computing frequency by using generalized zero-crossing applied to intrinsic mode functions”, US Patent 6,990,436 B1, 2006. [11] J. Von Neumann, “Distribution of the ratio of the mean square successive difference to the variance”, The Annals of Mathematical Statistics, 1941, pp. 367-395. [12] Cao, S., and Rhinehart, R. R., “An efficient method for on-line identification of steady-state”, Journal of Process Control, Vol. 5, No. 6, 1995, pp. 363-374. [13] Huang, N. E., Shen, Z., Long, S. R., Wu, M. C., Shih, H. H., Zheng, Q., Yen, N. C., Tung, C. C. and Liu, H. H., “The empirical mode decomposition and the Hilbert spectrum for nonlinear and non-stationary time series analysis,” Proceedings of Royal Society London. A, No. 454, 1998, pp. 903-995. [14] Bochner S., Chandrasekharan K. , “Fourier Transforms, Princeton University Press”,1949. [15] Aradhye, H.B., Bakshi, B.R., Strauss, R.A., Davis, J.F., “Multiscale SPC using wavelets—theoretical analysis and properties”,A.I.Ch.E. Journal 49, 2003, pp. 939-958. [16] Von Neumann, J., Kent, R., Bellinson, H. and Hart, B., “The mean square successive difference”, Ann. Math. Stat., 1941, pp. 153-162. [17] Rhinehart, R. R., “Automated steady and transient state identification in noisy processes”, American Control Conference, 2013, pp. 4477-4493. [18] Hald, A., Statistical theory with engineering applications, New York: Wiley, 1952. [19] Kramer, C. Y. and Jensen, D. R., “Fundamentals of multivariate analysis, Part II. inference about two treatments”, Journal of Quality Technology, Vol. 1, 1969, pp. 189-204. [20] Jackson, J.E., “A User’s Guide to Principal Components”, Wiley, New York, NY., 1991. [21] Nomikos, P. and MacGregor, J. F., “Monitoring batch processes using multiway principal component analysis”, AIChE J, Vol. 40, 1994, pp. 1361–1375. [22] Shewhart. W. A., “Economic control of quality of manufactured product”, D. Van Nostrand Company, 1931, pp. 501 [23] Gallagher, N.B., Wise, B.M., Butler, S.W., White, D.D. and Barna, G.G., “Development and benchmarking of multivariate of statistical process control tools for a semiconductor etch process: improving robustness through model updating”, Adechem, 1997. [24] Montgomery, “ Introduction to statistical quality control sixth edition”, Asia, 2009. [25] Crow, E.; Davis, F., “Statistics Manual”, Dover Publications, Mineola, NY., 1960.
|