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[1] Abdel-Hameed, M. (1975), “A gamma wear process,” IEEE Transactions on Reliability, 24(2), 152-153. [2] Basu, A. K. and Wasan, M. T. (1974), “On the first passage time processes of Brownian motion with positive drift,” Scandinavian Actuarial Journal, 1974(3), 144-150. [3] Berman, M. (1981), “Inhomogeneous and modulated gamma process,” Biometrika, 68(1), 143-152. [4] Chhikara, R. S. and Folks, L. (1989), The Inverse Gaussian Distribution Theory, Methodology, and Applications, Marcel Dekker, Inc. [5] Doksum, K. A. and Hóyland, A. (1992), “Model for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution,” Technometrics, 34(1), 74-82. [6] Huang, D. Y., Panchapakesan, S. and Tseng, S. T. (1984), “Some locally optimal subset selection rules for comparison with a control,” Journal of statistical planning and inference, 9(1), 63-72. [7] Lawless, J. F. (2002), Statistical Models and Methods for Lifetime Data, John Wiley & Sons, New York. [8] Lu, J. C. and Meeker, W. Q. (1993), “Using degradation measures to estimate a time- to-failure distribution,” Technometrics, 35(2), 161-174. [9] Meeker, W. Q. and Escobar, L. A. (1998), Statistical Methods for Reliability Data, New York: John Wiley & Sons. [10] Nelson, W. (1990), Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, John Wiley & Sons, New York. [11] Park, C. and Padgett, W. J. (2005), “Accelerated degradation models for failure based on geometric Brownian motion and gamma process,” Lifetime Data Analysis, 11(4), 511-527. [12] Park, C. and Padgett, W. J. (2006), “Stochastic degradation models with several accelerating variables,” IEEE Transactions on Reliability, 55(2), 379-390. [13] Singpurwalla, N. D. (1995), “Survival in dynamic environments,” Statistical Science, 10(1), 86-103. [14] Tsai, C. C., and Lin, C. T. (2014). Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes. Communications in Statistics-Theory and Methods, 43(10-12), 2419-2428. [15] Tsai, C. C., Tseng, S. T. and Balakrishnan, N. (2011), “Optimal burn-in for highly reliable products using gamma degradation process,” IEEE Transactions on Reliability, 60(1), 234-245. [16] Tseng, S. T. (1994), “Planning accelerated life tests for selecting the most reliable product,” Journal of statistical planning and inference, 41(2), 215-230. [17] Tseng, S. T., Hamada, M. and Chiao, C. H. (1995), “Using degradation data to improve fluorescent lamp reliability,” Journal of Quality Technology, 27(4), 363-369. [18] Tseng, S. T., Tang, J. and Ku, I. H. (2003), “Determination of burn-in parameters and residual life for highly reliable products,” Naval Research Logistics, 50(1), 1-14. [19] Wang, X. and Xu, D. (2010), “An inverse Gaussian process model for degradation data,” Technometrics, 52(2), 188-197. [20] Yu, H. F. and Tseng, S. T. (1999), “Designing a degradation experiment,” Naval Research Logistics, 46(6), 689-706. [21] Yu, H. F. and Tseng, S. T. (2002), “Designing a screening experiment for highly reliable products,” Naval Research Logistics, 49(5), 514-526. [22] Yu, H. F. (2003), “Optimal selection of the most reliable design whose degradation path satisfies a Wiener process,” International Journal of Quality & Reliability Management, 20(9), 1084-1095. [23] Yang, G. (2007), Life cycle reliability engineering, John Wiley & Sons.
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