量測材料的介電係數與導磁係數，長久以來都是科學界的一大課題。共振腔微擾法算是一個廣為人知的方法，但其適用條件及適用範圍都十分嚴苛，尤其中樣品本身只能單一存在介電特性或導磁特性的假設。本篇論文將描述如何利用不同波模( 及 )來量測同時擁有介電與導磁特性的物質在2.45GHz。
目前在HFSS模擬程式只要找到其適用條件與範圍，就可以利用多點校正的方式找到精準的介電係數與導磁係數。預期在實驗上應該也能得到相同結果。

摘要 i
致謝 ii
內文目錄 iii
附圖目錄 vi
附表目錄 viii
第一章 緒論 1
1.1 介電係數 1
1.2 導磁係數 3
1.3 HFSS 5
1.4 介電係數量測方法 7
1.5 研究動機 9
第二章 共振腔微擾法 10
2.1 基本假設 10
2.2 公式推導 10
2.3 介電係數推導 13
2.4 導磁係數推導 14
2.5 共振腔微擾法 15
2.6 待定係數求解 16
2.6.1 場積分求解 16
2.6.2 校正方法求解 18
2.7 改良方法 21
第三章 介電係數模擬 24
3.1 TM010模式介紹 24
3.2 Eigen-mode 25
3.2.1 腔體及樣品幾合結構與場型 25
3.2.2 Eigen-mode介電實部模擬結果 27
3.2.3 Eigen-mode介電虛部模擬結果 28
3.3 Driven-mode 32
3.3.1 耦合方法 32
3.3.2 場型與共振頻及Q 34
3.3.3 Teflon介電係數實部模擬結果 36
3.3.1 Teflon介電係數虛部模擬結果 37
3.3.4 FR4介電係數實部模擬結果 39
3.3.2 FR4介電係數虛部模擬結果 40
3.4 討論 42
第四章 導磁係數模擬 44
4.1 TE011模式介紹 44
4.2 Eigen-mode 45
4.2.1. 場型與幾何參數 45
4.2.1. Eigen-mode 導磁係數實部模擬結果 48
4.2.2. Eigen-mode 導磁係數實部模擬結果(改良版) 50
4.2.3. Eigen-mode 導磁係數虛部模擬結果 51
4.3 Driven-mode 53
4.3.1. 模式轉換器的原理 53
4.3.2. 腔體與模式轉換器結構 54
4.3.3. 場型與共振頻及Q 57
4.3.4. 實部部分模擬 59
4.3.5. 虛部部分模擬 61
第五章 量測方式比較 63
5.1. 傳統共振腔微擾法 63
5.2. 兩點校正法 64
5.3. 多點校正法 67
第六章 結論 69
參考文獻 70
Appendix 73

參考文獻
[1] William D. Callister, Jr., Materials Science And Engineering An
Introduction. New York: John Willey & Son.
[2] Standard Test Method D-2520-81, “Complex permittivity of solid
electrical insulating materials at microwave frequencies and
temperatures to 1650°C,” Amer. Soc for Testing and Materials,Philadelphia. PA
[3] Andrzej W. Kraszewski, Stuart O. Nelson, “Observation on Resonant
Cavity Perturbation by Dielectric Objects,” IEEE Trans. Microwave
Theory Tech., vol. 40, (1), pp. 151-155, Jan. 1992.
[4] Binshen Meng, John Booske, and Reid Cooper, “Extended Cavity
Perturbation Technique to Determine the Complex Permittivity of
Dielectric Materials,” IEEE Trans. Microwave Theory Tech., vol.
MTT-43, pp.2633-2635, 1995.
[5] Gholamreza Moradi, Ayaz Ghorbani, “Accurate Measurement of
Dielectric Porperties of Materials,” IEEE Int. Conf. Microwave and
Millimeter Wave Technology Proceedings, 2002, pp.130-133.
[6]David M.Pozar, Microwave Engineering.
[7]L. F. Chen, C. K. Ong and C. P. Neo National University of Singapore V. V. Varadan and V.K. Varadan Pennsylvania State University, USA , Microwave Electronics.
[8]John David Jackson, Classical Electrodynamics.
[9] B. R. Yu, T. H. Chang and K. R. Chu, High-Power Millimeter-Wave Rotary Joint
[10]盧福春,鄭春開 北京大學物理系教授,電動力學,4.9 電磁駐波與諧振腔
[11]Authur R. Von Hippel, Dielectric Materials and Applications. Authur
R. Von Hippel Eds., New York: The Technology Press of M.I.T. and
John Willey & Son, 1961.
[12]R. B. Yang, C. Y. Tsay, D. S. Hung, W. F. Liang, Y. D. Yao, and C. K. Lin, J. Appl. Phys. 105, 07A528 (2009)
[13] H. W. Chao and T. H. Chang, A modified calibration method for complex permittivity measurement
[14] Deepak K. Ghodgaonkar, Vasundara V. Varadan, and Vijay K. Varadan, “A Free-Space Method for Measurement of Dielectric Constants and Loss Tangents at Microwave Frequencies,” IEEE Trans. Instrum. Meas., vol. 37, pp. 789-793, Dec. 1989
[15] D. K. Ghodgaonkar, V. V. Varadan, and V. K. Varadan, “Free-Space
Measurement of Complex Permittivity and Complex Permeability of
Magnetic Materials at Microwave Frequencies,” IEEE Trans. Instrum.
Meas., vol. 39, pp. 387-394, Apr. 1990.
[16]B. Meng, J. Booske, and R. Cooper, IEEE Trans. Microw. Theory Tech. 43, 2633 (1995).
[17]L. Chen, C. K. Ong, and B. T. G. Tan, IEEE Trans. Instrum. Meas. 48, 1031(1999).
[18]V. Subramanian and J. Sobhanadri, Rev. Sci. Instrum. 65, 453 (1994)
[19]J. Jang, J. Y. Oh, S. K. Kim, Y. J. Choi, S. Y. Yoon, and C. O. Kim, Nature 395, 481 (1998).
[20] J. C. Booth, N. D. Orloff, J. Cagnon, J. Lu, and S. Stemmer, Appl. Phys. Lett. 97, 022902 (2010).
[21] Ahmet Baysar, and James L. Kuester, “Dielectric Property
Measurements of Materials Using the Cavity Technique,” IEEE Trans.
Microwave Theory Tech., vol. MTT-40, pp.2108-2110, 1992
[22] A. H. McCurdy, J. J. Choi, “Design and Analysis of a Coaxial Coupler
for a 35-GHz Gyroklystron Amplifier,” IEEE, vol. 47, no. 2,1999 [23] C. H. Lu, T. H. Chang and K. R. Chu, Investigation on Complex Permittivity of Dielectric Material at Ka-band