顯示器產業中透明元件之應用相當廣泛，如導光板、玻璃基板與導電薄膜等元件，隨著顯示器之輕薄化發展趨勢，元件品質倍受考驗，因此迫切需要一透明元件之檢測方法。然而透明元件通常需做表面處理方可量測，如此便無法於生產線上執行即時檢測。
因此，本研究將國立清華大學光測力學實驗室以往所架設之數位相位移式陰影雲紋法光學量測系統加以改良，藉由調整不同的光源入射角度與取像位置，擷取對比度較高之干涉條紋影像，並加入影像歪斜校正程序，將非試片法線方向取像之歪斜影像恢復為正面影像，以建立正確之表面形貌。利用本研究所提出之改良方法，可直接量測未經表面處理之透明導光板表面形貌。
另外，利用不同架設方式下所擷取之干涉條紋影像之量化光強值，建立本研究所架設之數位相位移式陰影雲紋量測系統之光反射模型，期能藉由此光反射模型，找出各種架設下的反射光強分布，進而評估出最佳之系統架設方式。

目錄 I
圖目錄 IV
表目錄 VII

一、簡介 1
二、文獻回顧 4
三、理論 8
3.1 陰影雲紋法[16] 8
3.2 相位移原理[1] 11
3.3 模數π轉換 14
3.4 相位展開法(Phase Unwrapping Method)[1,19] 15
3.5 Phong光照模型(Phong Illumination Model) 16
四、實驗裝置與試片規劃 20
4.1 實驗裝置 20
4.2 試片規劃 22
五、實驗程序 24
5.1 數位相位移式陰影雲紋法之量測程序 24
5.1.1 試片準備 24
5.1.2 數位相移式陰影雲紋法量測系統之架設 24
5.1.3 擷取影像 25
5.2 影像校正與相位分析程序 25
5.2.1 歪斜影像校正程序 27
5.2.2 求取相位圖與相位展開圖 27
5.2.3 匯出翹曲資訊並重建已修正之三維表面形貌圖 28
5.2.4 校正結果之偏差分析 28
5.3 光反射模型之建立 29
5.3.1 儀器架設與影像擷取 29
5.3.2 干涉條紋影像之光強量化 30
5.3.3 光反射模型之建立 31
六、結果與討論 35
6.1 未噴漆導光板量測實驗之結果 35
6.1.1 干涉條紋之量測結果與討論 35
6.1.2 相位圖與相位展開之結果與討論 36
6.2 影像歪斜校正之結果 38
6.3 光反射模型之建立與驗證 40
6.3.1 不同架設下干涉條紋影像之分析 40
6.3.2 光反射模型之建立 42
6.3.3 光反射模型之驗證 42
七、結論與未來展望 44
7.1 結論 44
7.2 未來展望 45
八、參考文獻 49

[1] 林育生, "導光板於不同溫濕負載下翹曲量之實驗與數值探討", 國立清華大學動力機械工程學系碩士論文, 2011.
[2] R. Weller and B. M. Shepherd, "Displacement Measurement by Mechanical Interferometry", Proc. Soc. Exp. Stress Anal., vol.VI, no.1, pp. 35-38, 1948.
[3] P. S. Theocaris, "Isopachic Patterns by the Moiré Method", Experimental Mechanics, vol. 4, no. 6, pp. 153-159, 1964.
[4] H. Takasaki, "Moiré Topography", Applied Optics, vol. 9, pp. 1467-1472, 1970.
[5] D. M. Meadows, W. O. Johnson, and J. B. Allen, "Generation of Surface Contours by Moiré Patterns", Applied Optics, vol. 9, pp. 942-947, 1970.
[6] J. B. Allen and D. M. Meadows, "Removal of Unwanted Patterns from Moiré Contour Maps by Grid Translation Techniques", Applied Optics, vol. 10, pp. 210-212, 1971.
[7] J. J. J. Dirckx, W. F. Decraemer, and G. Dielis, "Phase Shift Method Based on Object Translation for Full-Field Automatic 3-D Surface Reconstruction from Moiré Topograms", Applied Optics, vol. 27, pp. 1164-1169, 1988.
[8] J. L. Sullivan, "Phase-Stepped Fractional Moiré", Experimental Mechanics, vol. 31, pp. 373-381, 1991.
[9] T. Yoshizawa and T. Tomisawa, "Shadow Moiré Topography by Means of the Phase-Shift Method", Optical Engineering, vol. 32, pp. 1668-1674, 1993.
[10] J. A. Gómez-Pedrero, J. A. Quiroga, M. J. Terrón-López and D. Crespo, "Measurement of Surface Topography by RGB Shadow-Moiré with Direct Phase Demodulation", Optics and Lasers in Engineering, vol. 44, pp. 1297-1310, 2006.
[11] D. Kokidko, L. Gee, S. C. Chou and F. P. Chiang, "Method for Measuring Transient Out-of-Plane Deformation During Impact", International Journal of Impact Engineering, vol. 19, pp. 127-133, 1997.
[12] J. H. Lim, M. M. Ratnam and H. P. S. A. Khalil, "An Experimental and Finite Element Analysis of the Static Deformation of Natural Fiber-reinforced Composite Beam", Polymer Testing, vol. 22, pp. 169-177, 2003.
[13] K. S. Chen, T. Y. F. Chen, C. C. Chuang, and I. K. Lin, "Full-Field Wafer Level Thin Film Stress Measurement by Phase-Stepping Shadow Moiré", IEEE Transactions on Components and Packaging Technologies, vol. 27, pp. 594-601, 2004.
[14] M. A. Seif, U. A. Khashaba, and R. Rojas-Oviedo, "Measuring Delamination in Carbon/Epoxy Composites Using a Shadow Moiré Laser Based Imaging Technique", Composite Structures, vol. 79, pp. 113-118, 2007.
[15] 許軒豪, "背光模組熱濕變形之數值分析與實驗探討", 國立清華大學動力機械工程學系碩士論文, 2007.
[16] 張雅欣, "TFT-LCD 背光模組平面外溫濕位移場之實驗與數值探討", 國立清華大學動力機械工程學系碩士論文, 2009.
[17] 許軒豪, "國立清華大學光測力學實驗室工作日誌", 1月, 2007.
[18] 張雅欣, "國立清華大學光測力學實驗室工作日誌", 2-9月, 2008.
[19] R. S. Sirohi and F. S. Chau, "Optical Methods of Measurement", Marcel Dekker, Inc., New York, U. S. A., 1999.
[20] W. W. Macy, "Two-Dimensional Fringe-Pattern Analysis", Applied Optics, vol. 22, pp. 3898-3901, 1983.
[21] B. T. Phong, "Illumination for Computer Generated Pictures", Communications of the ACM, vol. 18, no. 6, pp. 311-317, 1975.
[22] Website: http://ww.hamamatsu.com/
[23] Website: http://www.tkk.com/websit
[24] Website: http://www.onset.com.tw/
[25] Website: http://www.surevision.com.tw/
[26] Website: http://tw.suruga-ost.com/company/
[27] Website: http://www.orientalmotor.com/
[28] Website: http://www.aisys.com.tw/web/about/
[29] Website: http://www.tamron.com.tw/home.html
[30] Website: http://www.samwells.com/
[31] Website: http://www.originlab.com/
[32] Website: http://www.epoch-optic.com/
[33] Website: http://www.mathworks.com/
[34] M. Born and E. Wolf, "Principles of Optics", 7th edition, Cambridge University Press, Cambridge, Chap. 4.8, 1999.
[35] D. A. Zwemer, J. Pan, G. J. Petriccione and S. P. McCarron, "Systems and Methods for Measuring Sample Surface Flatness of Continuously Moving Samples", U.S.A. Invention Patent, Patent Application Number: 11/241,318, 2005.