|
第一章 [1]Scott Mueller “Upgrading and Repairing PCs”(2003). [2]W. P. Meiklejohn, C. P. Bean, Phys. Rev., 102, 1413 (1956). [3]J. Nogue ́s, T.J. Moran, D. Lederman, I.K. Schuller, K.V. Rao, Phys. Rev. B. [4]黃榮俊、許峻瑜, 2007年諾貝爾物理獎—巨磁電阻的原理與應 用,科學新知, 426 期(2006 年06 月)。 [5]A. Fert et al, Phys. Rev. Lett, 61, 2472 (1988). [6]R. R. Katti, proceedings of the IEEE,91,687(2003). [7]國立雲林科技大學光電科學研究所碩士班碩士論文,雙絕緣層之垂直式磁穿隧接面結構及磁特性研究,張哲豪,民國95年。 [8]Z.Y.Liu and S.Adenwalla, J.Appl. Phys. 94, 1105(2003). [9]G. H. Yu and L. R. Zeng , J.Appl. Phys. 90, 4039 (2001) [10]D. Engel, A. Kronenberger, M. Jung, H. Schmoranzer, A. Ehresmann, A. Paetzild, K. Röll, J. Magn. Magn. Mater. 263,275(2003) [11]J. X. Shen and M. T. Kief , J.Appl. Phys.79, 5008 (1996) [12]De-Hau Han, Jian-Gang Zhu, and Jack H. Judy, J.Appl. Phys. 81, 304(1997) [13]Chih-Huang Lai, Hideo Matsuyama, Robert L. White, Thomas C. Anthony, and Gary G. Bush, J.Appl. Phys. 79,6389(1996) [14]R. P. Michel, A. Chaiken, C. T. Wang, and L. E. Johnson, Phys. Rev. B. 58,8566(1998) 第二章文獻回顧 [1]Scott Mueller “Upgrading and Repairing PCs”(2003). [2]W. P. Meiklejohn, C. P. Bean, Phys. Rev., 102, 1413 (1956). [3] J. Nogue ́s, T.J. Moran, D. Lederman, I.K. Schuller, K.V. Rao, Phys. Rev. B. [4]黃榮俊、許峻瑜, 2007年諾貝爾物理獎—巨磁電阻的原理與應 用,科學新知, 426 期(2006 年06 月)。 [5] A. Fert et al, Phys. Rev. Lett, 61, 2472 (1988). [6] R. R. Katti, proceedings of the IEEE,91,687(2003). [7]國立雲林科技大學光電科學研究所碩士班碩士論文,雙絕緣層之垂直式磁穿隧接面結構及磁特性研究,張哲豪,民國95年。 [8]Z.Y.Liu and S.Adenwalla, J.Appl. Phys. 94, 1105(2003). [9]G. H. Yu and L. R. Zeng , J.Appl. Phys. 90, 4039 (2001) [10]D. Engel, A. Kronenberger, M. Jung, H. Schmoranzer, A. Ehresmann, A. Paetzild, K. Röll, J. Magn. Magn. Mater. 263,275(2003) [11]J. X. Shen and M. T. Kief , J.Appl. Phys.79, 5008 (1996) [12]De-Hau Han, Jian-Gang Zhu, and Jack H. Judy, J.Appl. Phys. 81, 304(1997) [13]Chih-Huang Lai, Hideo Matsuyama, Robert L. White, Thomas C. Anthony, and Gary G. Bush, J.Appl. Phys. 79,6389(1996) [14]R. P. Michel, A. Chaiken, C. T. Wang, and L. E. Johnson, Phys. Rev. B. 58,8566(1998) 第二章文獻回顧 [1]Nicola A. Spaldin, "Magnetic Materials: Fundamentals and Applications”(2003) [2]杜怡君, 磁性基礎特性及磁性材料應用. [3]金重勳主編, ”Handbook of Magnetic Technologies”,中華民國磁性技術協會,(2002). [4]B.D.C., Introduction to magnetic magerials(1972) [5]Pu-Ling Lu and Stanley H. Charap, IEEE Trans. Magn., 30, 4230(1996) [6]S. N. Piramanayagam, JOURNAL OF APPLIED PHYSICS 102, 011301 (2007) [7]賴耿陽,“薄膜製作工藝學”,複漢出版社,1999年。 [8]K.H.Dae.K.H.Eun.C.Siyoung.Y.Y.Bong and L.D.Hyeon.“Microstructure Analyses of the Titanium Films Formed by the Ionized Sputtering Process”. Thin Solid Films.Vol.340,1999,pp.13-17 [9]S,M,Rossnagel,“Directional and Preferential Sputtering-Based Physical Vapor Deposition”. Thin Solid Films,Vol.263,1995,pp.1-12. [10]吉田貞史、白目靖寬,“薄膜工程學”,全華科技圖書,2004年。 [11]http://elearning.stut.edu.tw/m_facture/Nanotech/Web/ch3.htm [12]李岳霖,“熱處理對鎳鉻薄膜電阻特性之影響”,義守大學材料科學與工程學系碩士論文,2007年 [13]方宏聲,“電漿技術在平面顯示器製程之應用”,機械工業雜誌258期,pp.104-109。 [14]H.L.Hartnagel, A.K.Jain and C.Jagadish, “Smeiconducting Transparent Thin Films”,Published by Institute of Physics Publication,1995. [15]電漿反應器與原理http://proj.meoeaidb.gov.tw/eta/Handout/2004071310.pdf [16]董家齊、陳寬任,“奇妙的物質第四態-電漿”,科學發展,第354期,2002年6 月,pp.52-59。 17]陳世偉,“直流式磁控濺鍍鈷薄膜之表面結構變化與其應用於OME製程之研究”,國立成功大學材料科學與工程學系碩士論文,2004年。 [18]董寰乾、張六文,“濺鍍薄膜沉積技術簡介”,技術與訓練,第27卷,第4期,2002年6 月,pp.146-152。 [19]O.Milton, “Materials Science of Thin Film”Departement of Materials Science and Engineering Stevens Institute of Technology, Second Edition,2002. [20]S.Saha and S.B.Krupanidhi, “Microstructure Related Influence on the Electrical Properties of Pulsed Laser Ablated(Ba,Sr)TiO(sub3)Thin Filnms.”, J. Appl. Phys.,Vol,2000,pp.3506-3513. [21]Y.Mikami and K.Yamadam “Effect of DC Bias Voltage on the Deposition Rate for Ni Thin Films by RF-DC Coupled Unbalanced-Magnetron Sputtering.” Surface and Coatings Technology Vol,133-134,2000,295-300. [22]G.K.Hubler and J.A.Sprague, “Energetic Particles in PVD Technology:Particle-Surface Interaction Processes and Enegy-Particle Relationships in Thin Film Deposition. ” Surface and Coatings Technology,Vol81,1996,pp.29-35. [23]P.M.Witold, “Self-sustaioned Magnetron Co-Sputtering of Cu and Ni.”,Thin Solid Films,Vol.459,2004,pp.258-261 [24]宋增滄,“以迴旋濺鍍法成長氮化鋁薄膜之機制探討”,中原大學電子工程學系碩士論文,2003年六月。 [25]J. X. Shen and M. T. Kief , J. Appl. Phys.79, 5008 (1996) [26]G. H. Yu and L. R. Zeng , J. Appl. Phys. 90, 4039 (2001) [27]De-Hau Han, Jian-Gang Zhu, and Jack H. Judy, J. Appl. Phys.81, 304(1997) [28] De-Hau Han, Jian-Gang Zhu, and Jack H. Judy, J. Appl. Phys.81, 4996(1997) [29]G. H. Yu, C. L. Chai, F. W. Zhu, J. M. Xiao, and W. Y. Lai, Appl. Phys. Lett.78,1706(2001) [30]Chih-Huang Lai, Hideo Matsuyama, Robert L. White, Thomas C. Anthony, and Gary G. Bush, J. Appl. Phys.79,6389(1996) [31]Z. Y. Liu and S. Adenwalla, Appl. Phys. Lett. 82,2016(2003) [32]D. Engel, A. Kronenberger, M. Jung, H. Schmoranzer, A. Ehresmann, A. Paetzild, K. Röll, J. Magn. Magn. Mater. 263,275(2003) [33]R. P. Michel, A. Chaiken, C. T. Wang, and L. E. Johnson, Phys. Rev. B 58,8566(1998) [34]W. H. Meiklejohn, C. P. Bean, Phys. Rev. 102 (1956) 1413 [35]R. K. Zheng, Hui. Liu, Y. Wang, and X. X. Zhang, J. Appl. Phys. 96 (2004) 5370. [36]T. J. Moran, J. M. Gallego, I. K. Schuller, J. Appl. Phys. 78 (1995) 1887. [37]A. N. Dobrynin, D. N. levlev, K. Temst P. Lievens, J. Margueritat, J. Gonzalo, C. N. Afonso, S. Q. Zhou, A. Vantomme, E. Piscopiello, and G. Van Tendeloo, Appl. Phys. Lett. 87, (2005) 012501 . [38]J. Nogue’s, C. Leighton and Ivan K. Schuller, Phys. Rev. B 61 (2000-II) 1315. [39]X. Ke, M. S. Rzchowski, L. J. Belenky, and C. B. Eom, Appl. Phys. Lett. 84, (2004) 5458 [40]J. Nogue’s and Ivan K. Schuller, J. Magn. Magn. Mater. 192 (1999) 203. [41]W.H. Meiklejohn, J. Appl. Phys. 33,1328(1962) [42]A. E. Berkowitz, and Kentaro Takano, J. Magn. Magn. Mater. 200 (1999) 552. [43]D. Mauri, H. C. Siegmann, P. S. Bagus, E. Kay, J. Appl. Phys. 62 (1987) 3047 [44]A. P. Malozemoff, Phys. Rev. B 35 (1987) 3679. [45]A. P. Malozemoff, J. Appl. Phys. 63 (1988) 3874. [46]A. P. Malozemoff, Phys. Rev. B 37 (1988) 7673. [47]N. C. Koon, Phys. Rev. Lett. 78 (1997) 4865. [48]T. C. Schulthess, W. H. Butler, Phys. Rev. Lett., 81 (1998) 4516. [49]Kentaro Takano, R. H. Kodama, A. E. Berkowitz, W. Cao,, J. Appl. Phys. 83 (1998) 6888 [50]Florin Radu , Hartmut Zabel , cond-mat.mtrl-sci , 0705.2055v1. [51]U. Nowak , K. D. Usadel , Phys. Rev. B 66 (2002) 014430. [52]U. Nowak, A. Misra, K. D. Usadel, J. Appl. Phys. 389 (2001) 7268. [53]P. Miltényi ,M. Gierlings , J. Keller, B. Beschoten, Phys. Rev. Lett. 84, (2000) 4224. [54]Joo-Von Kim, R. L. Stamps, Phys. Rev. B. 71, 094495(2005) [55]F. Radu, A. Westphalen, K. Theis-Brohl, H. Zabel., J. Phys.:Condens. Matter 18, L29(2006) [56]J. Nogues, D. Lederman, T. J. Moran, Ivan K. Schuller, Phys. Rev. Lett. 76, 4624 (1996) [57]N. N. Phuoc, N. P. Thuy, N. A. Tuan, L. T. Hung, N. T. Thanh, N. T. Nam, J. Magn. Magn. Mater. 298, 43 (2006) [58] W. L. Roth, Phys. Rev., 110, 6, 1958. [59]Takashi Hotta, Seiji Yunoki, Matthias Mayr, and Elbio Dagotto,Phys.Rev.B 60(1999)22 [60]S.D. Berry, D.M. Lind, E. Lochner, K.A. Shaw, D. Hilton, R.W. Erwin, J.A. Borchers, Mater. Res. Soc. Symp. Proc. 313 (1993) 779. [61]D.M. Lind, S.P. Tay, S.D. Berry, J.A. Borchers, R.W. Erwin, J. Appl. Phys. 73 (1993) 6886. [62]G.P. Felcher, Y.Y. Huang, M. Carey, A.E. Berkowitz, J. Magn. Magn. Mater. 121 (1993) 105. [63]S.S.P. Parkin, V.P. Deline, R.O. Hilleke, G.P. Felcher, Phys. Rev. B 42 (1990) 10538. [64]J. H. Van Vleck, Electric and Magnetic Susceptibilities, Oxford University Press, New York, 1932, p. 282~310. [65]R. R. Wenner, Thermochemical Calculations McGraw-Hill Book Company, Inc., New York, 1941, p. 145. [66]中興大學材料工程學系碩士論文,鎳鐵/鎳鐵氧化物雙層薄膜顯微結構之分析及其交換偏壓性質,劉家政,民95年。 [67]B. Fultz and J. M. Howe: “Transmission Electron Microscopy and Diffractometry of Materials”, Springer 2002 [68]Earl J. Kirkland, Advanced computing in electron in electron microscopy (1998) , p133-138. [69]JEMS software package that is developed by Pierre Stadelmann, http://cimesg1.epfl.ch/CIOL/ems.html 第三章實驗方法 [1]Kenny Liu, Ion Beam Source, Veeco [2]Veeco ion source(產品說明書) [3]國立中央大學光電科學研究所碩士論文,離子輔助反應射頻磁控濺鍍紫外光薄膜之研究,戴國良,民國九十年 [4]汪建民, 材料分析. 中國材料科學學會. [5]B. D. Cullity, Elements of X-RAY Diffraction, 3rd ed, (2001) [6]中興大學材料工程學系碩士論文,奈米尺寸Co/Pt多層膜垂直異向性探討,蘇群皓,民國97年 [7]SPM presentation for basic training, Veeco [8]C.D. Wright, E.W.Hill:Reciprocity in magnetic force microscopy. Appl.Phys.Lett. 67,433-435 1995. [9]物理雙月刊24卷5期(2002) [10]B. D. Cullity, Elements of X-RAY Diffraction, 3rd ed, (2001) 第四章結果與討論 [1]Japanese Industrial Standards B 0601(1994) [2]F. A. Smidth, International Materials Reviews 35, 61(1990) [3]M. MARINOV: Thin Solid Films, 1977, 46, 267. [4]T. c. HUANG, G. LIM, F. PARMIGIANI, and E. KAY; J. Vac. Sci. Technol.1985, A3, 2161. [5]F. PARMIGIANI, E. KAY, T. C. HUANG, 1. PERRIN, M. JURICH, and 1. D. SWALEN: Phys. Rev., 1986, B33, 879. [6]D. DOBREV: Thin Solid Films, 1982, 92, 41. [7]c. H. CHOI, R. RAMANARAYANAN, S.-N. MEl, and T.-M. LU: in'Materials modification and growth using ion beams', (ed.U: J. Gibson et al.), Mater. Res. Soc. Symp. Proc., 1987,93, 267. [8]R. MESSIER and R. C. ROSS: J. Appl. Phys., 1982, 53, 6220. [9]G. N. VAN WYK and H.1. SMITH: Nucl. Instrum. Meth.1980, 170,433. [10]R. A. ROY, D. S. YEE, and J. 1. CUOMO: in 'Processing and characterization of materials used in ion beams', (ed. L. E.Rehn et al.), Mater. Res. Soc. Symp. Proc., 1989, 128,23. [11]P. WANG, D. A. THOMPSON, and W. W. SMELTZER: Nucl. Instrum. Meth. Phys. Res., 1986, B16, 288. [12]J. c. LIU and 1. W. MAYER: Nucl. Instrum. Meth. Phys. Rev., 1987, BI9/20, 538. [13]E. KAY, F. PARMIGIANI, and w. PARRISH: J. Vac. Sci. Technol., 1988, A6, 3074. [14]K. S. GRABOWSKI, R. A. KANT, and s. B. QUADRI: in 'Processing and characterization of materials used in ion beams', (ed. L. E. Rehn et al.), Mater. Res. Soc. Symp. Proc., 1989, 128, 279. [15]Y. NAGAI, A. TAGO, and T. TOSHIMA: J. Vac. Sci. Technol.,1987, AS, 61. [16]A.E. Berkowitz, Kentaro Takano , J. Magn. Magn. Mater. 200 (1999) 552-570 [17]Cathcart JV, Peterson GF, Sparks CJ (1969) J. Electrochem. Soc. 116:664. [18]Herchl R, Khoi NN, Homma T, Smeltzer WW (1972) Proceedings of the Soil Science Society of America 4:35. [19]Graham MJ, Hussey RJ, Cohen M (1973) J. Electrochem. Soc. 120:1523. [20]Khoi NN, Smeltzer WW, Embury JD (1975) J. Electrochem. Soc. 122:1495. [21]Czerwinski F, Szpunar JA (1998) Acta Mater. 46:1403. [22]Czerwinski F, Zhilyaev A, Szpunar JA (1999) Corros. Sci. 41:1703. [23]劉金聲,離子束沈積薄膜技術及應用,國防工業出版社 344-347(2003) [24]J. J. Cuomo, S. M. Rossnagel, H. R. Kaufman, “Handbook of ion beam processing technology” (1989) [25]逢甲大學材料科學與工程學系碩士論文,雙離子束濺鍍鋅鉬氧化物薄膜於聚醚堸基板之光電特性研究,何紹誌,民國98年。 [26]J.L.Yang, Y.S.Lai, J.S.Chen“ Effect of heat treatment on the properties of non-stoichiometric p-type nickel oxide films deposited by reactive sputtering”,Thin Solid Films 488(2005)242-246. [27]P. ZIEMAN and E. KAY: J. Vac. Sci. Technol., 1983, AI, 512. [28]P. Scherrer, Göttinger Nachrichten Gesell., Vol. 2, 1918, p 98. [29]A. P. Malozemoff, Phys. Rev. B 35 (1987) 3679. [30]A. P. Malozemoff, J. Appl. Phys. 63 (1988) 3874. [31]A. P. Malozemoff, Phys. Rev. B 37 (1988) 7673.
|