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[1] MICRON Technology Inc., "DDR SDRAM Functionality and Controller Read Data Capture," DesignLine, Vol.8, Issue 3, Sep. 1999. [2] C.-C. Chung and C.-Y. Lee, "A new DLL-based approach for all-digital multiphase clock generation," IEEE Journal of Solid-State Circuits, vol. 39, no. 3, pp. 469-475, March 2004. [3] C.-C. Chung, P.-L. Chen and C.Y. Lee, "An All-Digital Delay-Locked Loop for DDR SDRAM Controller Applications," Proc. of Int’l Symposium on VLSI Design, Automation and Test, pp. 1-4, 2006. [4] P.-C. Huang and S.-Y. Huang, "Cell-based delay locked loop compiler," Proc. of Int’l SoC Design Conference (ISOCC), pp. 91-92, 2016. [5] T. Olsson and P. Nilsson, " A Digitally Controlled PLL for SoC Applications," IEEE J. Solid-State Circuits, vol. 39, no. 5, pp.751-760, May 2004. [6] J.-Y. Yang and S.-Y. Huang, "Fault and Soft Error Tolerant Delay-Locked Loop," Proc. of IEEE 29th Asian Test Symposium (ATS), pp. 1-6, 2020. [7] K. Arshak, O. Abubaker, and E. Jafer, "Design and simulation difference types CMOS phase frequency detector for high speed and low jitter PLL," Proc. 5th IEEE Int’l Caracas Conf. Devices Circuits Syst., vol. 1, pp. 188-191, Nov. 2004. [8] Y. -p. Zhou, Z. -q. Lu and Y. -z. Ye, "A Double-Edge-Triggered Phase Frequency Detector for Low Jitter PLL," in Proc. International Conference on Solid-State and Integrated Circuit Technology Proceedings (ICSICT), pp. 1963-1965, Oct. 2006. [9] W. Chu and S.-Y. Huang, "Online Safety Checking for Delay Locked Loops via Embedded Phase Error Monitor", IEEE Trans. on Emerging Topics in Computing (TETiC), (Early Access Article, 2019). [10] J.-Y. Yang and S.-Y. Huang, "Tiny Phase-Error Monitor for Fault and Soft-Error-Tolerant DLL to Support Graceful Degradation and Module-Level Testing," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 41, no. 7, pp. 2337-2347, July 2022. [11] “EDA cloud Cell-based Flow” Taiwan Semiconductor Research Institute, TSRI, Taiwan. [12] H.-J. Hsu, C.-C. Tu and S.-Y. Huang, "A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory," Proc. of IEEE Int’l Symposium on VLSI Design, Automation and Test (VLSI-DAT), 2008. [13] K. Ryu, D. -H. Jung and S. -O. Jung, "Process-Variation-Calibrated Multiphase Delay Locked Loop With a Loop-Embedded Duty Cycle Corrector," IEEE Trans. on Circuits and Systems II: Express Briefs, vol. 61, no. 1, pp. 1-5, Jan. 2014. [14] J. -H. Chae, H. Ko, J. Park and S. Kim, "A Quadrature Clock Corrector for DRAM Interfaces, With a Duty-Cycle and Quadrature Phase Detector Based on a Relaxation Oscillator," IEEE Trans. on VLSI Systems (TVLSI), vol. 27, no. 4, pp. 978-982, April 2019. [15] S. Shin, H. -G. Ko, S. Jang, D. Kim and D. -K. Jeong, "22.6 A 0.8-to-2.3GHz Quadrature Error Corrector with Correctable Error Range of 101.6ps Using Minimum Total Delay Tracking and Asynchronous Calibration On-Off Scheme for DRAM Interface," in IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers, San Francisco, CA, USA, 2020, pp. 340-342. [16] J. -W. Sull et al., "An 8-GHz Octa-Phase Error Corrector With Coprime Phase Comparison Scheme in 40-nm CMOS," IEEE Trans. on Circuits and Systems II: Express Briefs, vol. 69, no. 3, pp. 874-878, March 2022.
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