|
[1]. Hu, C. H., Lee, M. Y. and Tang, J. (2015). Optimum Step-stress Accelerated Degradation Test for Wiener Degradation Process Under Constraints. European Journal of Operational Research, 241(2), 412-421. [2]. Lindqvist, B. H., Elvebakk, G. and Heggland, K. (2003). The Trend-Renewal Process for Statistical Analysis of Repairable Systems. Technometrics, 45(1), 31-44. [3]. Lee, I. C., Hong, Y., Tseng, S. T. and Desgupta, T. (2018). Sequential Bayesian Design for Accelerated Life Tests. Technometrics, 60(4), 472-483. [4]. Lee, I. C., Tseng, S. T. and Hong, Y. (2020). Global Planning of Accelerated Degradation Tests Based on Exponential Dispersion Degradation Models. Naval Research Logistics, 67(6), 469-483. [5]. Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data. Wiley & Sons, New York. [6]. Nelson, W. (1990). Accelerated Testing: Statistical Models, Testing Plan and Data Analysis. Wiley & Sons, New York. [7]. Park, J. I. and Bae, S. J. (2010). Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes from Accelerated Degradation Tests. IEEE Transactions on Reliability, 59(1), 74-90. [8]. Peng, C. Y. and Tseng, S. T. (2010). Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products. IEEE Transactions on Reliability, 59(1), 30-37. [9]. Tseng, S. T. and Lee, I. C. (2016). Optimum Allocation Rule for Accelerated Degradation Tests with A Class Of Exponential-Dispersion Degradation Models. Technometrics, 58(2), 244-254. [10]. Tseng, S. T. and Wen, Z. C. (2000). Step-Stress Accelerated Degradation Analysis for Highly Reliable Products. Journal of Quality Technology, 32(3), 209-216. [11]. Tseng, S. T., Balakrishnan, N. and Tsai, C. C. (2009). Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. IEEE Transactions on Reliability, 58(4), 611-618. [12]. Wang, Y. F., Tseng, S. T., Lindquvist, B. H. and Tsui, K. L. (2019). End Of Performance Prediction of Lithium-Ion Batteries. Journal of Quality Technology, 51(2), 198-213. [13]. Ye, Z. S., Chen, L. P., Tang, L. C. and Xie, M. (2014). Accelerated Degradation Test Planning Using The Inverse Gaussian Process. IEEE Transactions on Reliability, 63(3), 750-763. [14]. 林立元 (2020), "可回充電池的逐步應力衰變試驗之建模與分析", 國立清華大學統計學研究所碩士論文。 [15]. 陳信諺 (2022), "鋰離子電池之循環式逐步應力衰變試驗的設計與分析", 國立清華大學統計學研究所碩士論文。
|