|
[1] G. Kelly et al., "Accurate prediction of PQFP warpage," in 44th Electronic Components & Technology Conference - 1994 Proceedings, (Proceedings - Electronic Components and Technology Conference. New York: IEEE, 1994, pp. 102-106. [2] G. Kelly et al., "The importance of molding compound chemical shrinkage in the stress and warpage analysis of PQFPs," in 45th Electronic Components & Technology Conference - 1995 Proceedings, (Proceedings - Electronic Components and Technology Conference. New York: IEEE, 1995, pp. 977-981. [3] J. Standard, "Package warpage measurement of surface-mount integrated circuits at elevated temperature," 2009. [4] J. Standard, "Measurement Methods of Package Warpage at Elevated Temperature and Maximum Permissive Warpage," 2007. [5] K. Oota and K. Shigeno, "Development of molding compounds for BGA," presented at the 45th Electronic Components & Technology Conference - 1995 Proceedings, New York, 1995. [6] B. Z. Zhao, V. Pai, C. Brahateeswaran, G. J. Hu, S. Chew, and N. Chin, FEA simulation and in-situ warpage monitoring of laminated package molded with green EMC using Shadow Morie system (Icept: 2006 7th International Conference on Electronics Packaging Technology, Proceedings). New York: IEEE, 2006, pp. 176-+. [7] N. Srikanth, C. Lim, and B. Kumar, "A Viscoelastic Warpage Analysis of Molded Packages," in Technical Symposium, Semicon Singapore, 2002, pp. 89-99. [8] G. J. Hu, G. K. Yong, J. E. Luan, L. W. Chin, and X. Baraton, "Thermoelastic Properties of Printed Circuit Boards: Effect of Copper Trace," in 2009 European Microelectronics and Packaging Conference, (European Microelectronics Packaging Conference. New York: IEEE, 2009, pp. 321-326. [9] L. O. McCaslin, S. Yoon, H. Kim, and S. K. Sitaraman, "Methodology for Modeling Substrate Warpage Using Copper Trace Pattern Implementation," IEEE Trans. Adv. Packag., Article; Proceedings Paper vol. 32, no. 4, pp. 740-745, Nov 2009, doi: 10.1109/tadvp.2009.2023464. [10] C. S. Chen, N. Kao, and D. S. Jiang, Different Conservation Laws Utilized for Warpage Prediction of MUF FCCSP with 4L ETS (Proceedings of the 2016 Ieee 18th Electronics Packaging Technology Conference). New York: IEEE, 2016, pp. 313-319. [11] K. Biswas, S. G. Liu, X. W. Zhang, and T. C. Chai, "Development of Numerical Modeling Approach on Substrate Warpage Prediction," presented at the Proceedings of the 2012 Ieee 14th Electronics Packaging Technology Conference, New York, 2012. [12] C. C. Meng, S. Stoeckl, H. Pape, F. M. Yee, and T. A. Min, "Effect of Substrate Warpage on Flip Chip BGA Thermal Stress Simulation," presented at the 2010 12th Electronics Packaging Technology Conference, New York, 2010. [13] W. Lin, B. Baloglu, and K. Stratton, "Coreless Substrate with Asymmetric Design to Improve Package Warpage," presented at the 2014 Ieee 64th Electronic Components and Technology Conference, New York, 2014. [14] C. C. Chen, M. Z. Lin, G. C. Liao, Y. C. Ding, and W. C. Cheng, "Balanced Embedded Trace Substrate Design for Warpage Control," presented at the 2015 Ieee 65th Electronic Components and Technology Conference, New York, 2015. [15] S. Timoshenko, "Analysis of bi-metal thermostats," (in English), J. Opt. Soc. Am. Rev. Sci. Instrum., Article vol. 11, no. 3, pp. 233-255, Sep 1925, doi: 10.1364/josa.11.000233. [16] Y. H. Laio and M. C. Shih, "The Study of Warpage of a Flip Chip Embedded Trace Substrate," presented at the 2016 11th International Microsystems, Packaging, Assembly and Circuits Technology Conference, New York, 2016. [17] M. J. Wang and B. Wells, "Substrate Trace Modeling for Package Warpage Simulation," presented at the 2016 Ieee 66th Electronic Components and Technology Conference, Los Alamitos, 2016. [18] Q. S. Yang and W. Becker, "Numerical investigation for stress, strain and energy homogenization of orthotropic composite with periodic microstructure and non-symmetric inclusions," (in English), Comp Mater Sci, vol. 31, no. 1-2, pp. 169-180, Sep 2004, doi: 10.1016/j.commatsci.2004.01.040. [19] Z. Hashin, J Journal of Applied Mechanics, "Analysis of composite materials—a survey," vol. 50, no. 3, pp. 481-505, 1983. [20] S. Nemat-Nasser, M. Lori, and S. Datta, "Micromechanics: overall properties of heterogeneous materials," ed, 1996. [21] M. T. Bedialauneta, I. Albizu, E. Fernandez, and A. J. Mazon, "Uncertainties in the testing of the coefficient of thermal expansion of overhead conductors," Energies, vol. 13, no. 2, p. 411, 2020. [22] E. Pavlina and C. Van Tyne, "Correlation of yield strength and tensile strength with hardness for steels," Journal of materials engineering and performance, vol. 17, no. 6, pp. 888-893, 2008 [23]Raissi, Maziar, Paris Perdikaris, and George E. Karniadakis. "Physics-informed neural networks: A deep learning framework for solving forward and inverse problems involving nonlinear partial differential equations." Journal of Computational physics 378 (2019) [24]Baydin, Atilim Gunes, et al. "Automatic differentiation in machine learning: a survey." Journal of Marchine Learning Research 18 (2018): 1-43 [25] Mao, Zhiping, Ameya D. Jagtap, and George Em Karniadakis. "Physics-informed neural networks for high-speed flows." Computer Methods in Applied Mechanics and Engineering 360 (2020): 112789. [26] Krizhevsky, Alex, Ilya Sutskever, and Geoffrey E. Hinton. "Imagenet classification with deep convolutional neural networks." Advances in neural information processing systems 25 (2012). [27] Lake, Brenden M., Ruslan Salakhutdinov, and Joshua B. Tenenbaum. "Human-level concept learning through probabilistic program induction. [28] Alipanahi, Babak, et al. "Predicting the sequence specificities of DNA-and RNA-binding proteins by deep learning.
|