|
[1] R. P. Feynman, “Simulating physics with computers,” in Feynman and computation, pp. 133–153, CRC Press, 2018. [2] J. M. Martinis, M. H. Devoret, and J. Clarke, “Energy-level quantization in the zerovoltage state of a current-biased josephson junction,” Physical review letters, vol. 55, no. 15, p. 1543, 1985. [3] M. H. Devoret, J. M. Martinis, and J. Clarke, “Measurements of macroscopic quantum tunneling out of the zero-voltage state of a current-biased josephson junction,” Physical review letters, vol. 55, no. 18, p. 1908, 1985. [4] Y. Nakamura, Y. A. Pashkin, and J. Tsai, “Coherent control of macroscopic quantum states in a single-cooper-pair box,” nature, vol. 398, no. 6730, pp. 786–788, 1999. [5] A. Wallraff, D. I. Schuster, A. Blais, L. Frunzio, R.-S. Huang, J. Majer, S. Kumar, S. M. Girvin, and R. J. Schoelkopf, “Strong coupling of a single photon to a superconducting qubit using circuit quantum electrodynamics,” Nature, vol. 431, no. 7005, pp. 162–167, 2004. [6] J. Koch, M. Y. Terri, J. Gambetta, A. A. Houck, D. I. Schuster, J. Majer, A. Blais, M. H. Devoret, S. M. Girvin, and R. J. Schoelkopf, “Charge-insensitive qubit design derived from the cooper pair box,” Physical Review A, vol. 76, no. 4, p. 042319, 2007. [7] M. A. Nielsen and I. L. Chuang, “Quantum computation and quantum information,” Phys. Today, vol. 54, no. 2, p. 60, 2001. [8] B. D. Josephson, “Possible new effects in superconductive tunnelling,” Physics letters, vol. 1, no. 7, pp. 251–253, 1962. [9] R. Jaklevic, J. Lambe, A. Silver, and J. Mercereau, “Quantum interference effects in josephson tunneling,” Physical Review Letters, vol. 12, no. 7, p. 159, 1964. [10] T. Van Duzer and C. W. Turner, “Principles of superconductive devices and circuits,” 1981. [11] T. Duty, D. Gunnarsson, K. Bladh, and P. Delsing, “Coherent dynamics of a josephson charge qubit,” Physical Review B, vol. 69, no. 14, p. 140503, 2004. [12] K. Lehnert, K. Bladh, L. Spietz, D. Gunnarsson, D. Schuster, P. Delsing, and R. Schoelkopf, “Measurement of the excited-state lifetime of a microelectronic circuit,” Physical review letters, vol. 90, no. 2, p. 027002, 2003. [13] K. Koshino and Y. Nakamura, “Control of the radiative level shift and linewidth of a superconducting artificial atom through a variable boundary condition,” New Journal of Physics, vol. 14, no. 4, p. 043005, 2012. [14] C. Quintana, A. Megrant, Z. Chen, A. Dunsworth, B. Chiaro, R. Barends, B. Campbell, Y. Chen, I.-C. Hoi, E. Jeffrey, et al., “Characterization and reduction of microfabricationinduced decoherence in superconducting quantum circuits,” Applied Physics Letters, vol. 105, no. 6, p. 062601, 2014. [15] K. Zhang, M.-M. Li, Q. Liu, H.-F. Yu, and Y. Yu, “Bridge-free fabrication process for al/alox/al josephson junctions,” Chinese Physics B, vol. 26, no. 7, p. 078501, 2017. [16] K. Kurihara, K. Iwadate, H. Namatsu, M. Nagase, H. Takenaka, and K. M. K. Murase, “An electron beam nanolithography system and its application to si nanofabrication,” Japanese journal of applied physics, vol. 34, no. 12S, p. 6940, 1995. [17] B. Cord, J. Yang, H. Duan, D. C. Joy, J. Klingfus, and K. K. Berggren, “Limiting factors in sub-10 nm scanning-electron-beam lithography,” Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, vol. 27, no. 6, pp. 2616–2621, 2009. [18] S. Steenbrink, B. Kampherbeek, M. Wieland, J. Chen, S. Chang, M. Pas, J. Kretz, C. Hohle, D. van Steenwinckel, S. Manakli, et al., “High throughput maskless lithography: low voltage versus high voltage,” in Emerging Lithographic Technologies XII, vol. 6921, pp. 547–556, SPIE, 2008. [19] P. Kruit and S. Steenbrink, “Shot noise in electron-beam lithography and line-width measurements,” Scanning, vol. 28, no. 1, pp. 20–26, 2006. [20] B. E. M. B. E. Maile, W. H. W. Henschel, H. K. H. Kurz, B. R. B. Rienks, R. P. R. Polman, and P. K. P. Kaars, “Sub-10 nm linewidth and overlay performance achieved with a fine-tuned ebpg-5000 tfe electron beam lithography system,” Japanese Journal of Applied Physics, vol. 39, no. 12S, p. 6836, 2000. [21] 楊穎枚, “Electron beam lithography system,” 2011. https://cmnst-cfc.ncku.edu.tw/ var/file/197/1197/img/96/ELIONIX_ELS7500_SOP_20110418.pdf. [22] P. D. H.-G. Braun, “Lab course-electron beam lithography,” |