為了提高對安全至關重要的 IC 產品的可靠性，篩選出具有早夭傾向的設備並預測設備壽命是重要的課題。在這種觀點下，壓力測試對於支持可靠性篩選變得越來越必要。然而需要施加到設備上的壓力時間量通常是難以確定且神秘的。在burn-in或環境應力篩選等傳統壓力測試方法中，故障概率較高的個體在測試過程中會在相對較短的時間內失效。通過這種方式可以將故障概率較高的個體篩選出來，但是可能仍然需要一段時間才能出現故障。另一方面，當設備具備速度分級能力時，測試人員將能夠在設備失效前觀察到設備老化的趨勢。在本論文中，我們制定了一個適當壓力測試程序，以便可以明智地確定壓力測試時間，而不會有錯過有早夭傾向個體造成的設備的風險。此外，當可以在短時間內預測器件壽命，它可以成為判斷產品可靠性的基準。我們還提出了一種基於多應力水平的壽命預測方法，該方法允許用戶在速度分級的幫助下快速預測設備壽命，相對於以前的做法以值得信賴的方式進行預測，避免因進行遠距離預測而導致的不准確。

In order to improve reliability of safety-critical IC products, screen out devices with Infant Mortality (IM) prone and predict device lifetime are significant topics. Under this point of view, stress test has become increasingly more necessary to support reliability screening. However, the amount of stress time that needs to be applied is often hard-to-decide and mysterious. In traditional stress test methods such as burn-in or Environmental Stress Screening (ESS), weak devices with higher failure probability will fail in a relatively short period of time during the testing process. Weak devices can be screened out in this way, but it may still take a while to stress devices to fail. On the other hand, when device has the ability of speed grading, testers will be able to observe the trend of device aging before it fails. In this thesis we formulate a “Just-Enough” stress test procedure so that the stress time can be determined judiciously without risking the possibility of missing out the target IM-inflicted devices. Furthermore, if device lifetime can be predicted in a short amount of time, it can become a benchmark for judging the reliability of product. In this thesis we also propose a Multi-Stress-Level-Based lifetime prediction method that allows users quickly predict device lifetime with the help of speed grading, avoiding the inaccurate due to far-stretching prediction in a trustworthy way relative to previous work.

Abstract...............................................i
摘要...................................................ii
致謝..................................................iii
Content................................................iv
List of Figures.........................................v
List of Tables........................................vii
Chapter 1 Introduction..................................1
1.1 Introduction........................................1
1.2 Thesis Organization.................................7
Chapter 2 Just-Enough Stress Test for Infant Mortality Fault Screening ........................................................8
2.1 Preliminary.........................................8
2.2 Basic Stress Test Scheme............................11
2.3 Just-Enough Stress Test Scheme......................16
2.4 Experimental Result.................................24
2.5 Tool Demonstration..................................25
Chapter 3 Multi-Stress-Level-Based Lifetime Prediction..26
3.1 Preliminary.........................................26
3.2 Multi-Stress-Level-Based Lifetime Prediction........30
3.3 Experimental Result.................................35
3.4 Tool Demonstration..................................36
Chapter 4 Conclusion....................................38
References..............................................39

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