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[1] M. K. Hatalis and D. W. Greve, "Large grain polycrystalline silicon by low‐temperature annealing of low‐pressure chemical vapor deposited amorphous silicon films," Journal of applied physics, vol. 63, no. 7, pp. 2260-2266, 1988. [2] N. Yamauchi and R. Reif, "Polycrystalline silicon thin films processed with silicon ion implantation and subsequent solid‐phase crystallization: Theory, experiments, and thin‐film transistor applications," Journal of applied physics, vol. 75, no. 7, pp. 3235-3257, 1994. [3] K. Zellama, P. Germain, S. Squelard, J. Bourgoin, and P. Thomas, "Crystallization in amorphous silicon," Journal of Applied Physics, vol. 50, no. 11, pp. 6995-7000, 1979. [4] L. Herbst, H.-J. Kahlert, B. Fechner, U. Rebhan, and R. Osmanow, "300 W XeCl excimer laser annealing and sequential lateral solidification in low temperature poly-silicon technology," in Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas, 2003, vol. 5004: International Society for Optics and Photonics, pp. 69-76. [5] W. Sinke and F. Saris, "Evidence for a self-propagating melt in amorphous silicon upon pulsed-laser irradiation," Physical Review Letters, vol. 53, no. 22, p. 2121, 1984. [6] J. P. Callan, Ultrafast dynamics and phase changes in solids excited by femtosecond laser pulses. Harvard University, 2000. [7] S. Sundaram and E. Mazur, "Inducing and probing non-thermal transitions in semiconductors using femtosecond laser pulses," Nature materials, vol. 1, no. 4, pp. 217-224, 2002. [8] C. Shank, R. Yen, and C. Hirlimann, "Time-resolved reflectivity measurements of femtosecond-optical-pulse-induced phase transitions in silicon," Physical Review Letters, vol. 50, no. 6, p. 454, 1983. [9] G. Jellison Jr, D. Lowndes, and R. Wood, "The optical functions of silicon at elevated temperatures and their application to pulsed laser annealing," Oak Ridge National Lab., TN (United States), 1993. [10] T. Y. Choi and C. P. Grigoropoulos, "Plasma and ablation dynamics in ultrafast laser processing of crystalline silicon," Journal of applied physics, vol. 92, no. 9, pp. 4918-4925, 2002. [11] J.-M. Shieh, Z.-H. Chen, B.-T. Dai, Y.-C. Wang, A. Zaitsev, and C.-L. Pan, "Near-infrared femtosecond laser-induced crystallization of amorphous silicon," Applied physics letters, vol. 85, no. 7, pp. 1232-1234, 2004. [12] B. R. Tull, Femtosecond laser ablation of silicon: nanoparticles, doping and photovoltaics. Harvard University, 2007. [13] D. Von der Linde, K. Sokolowski-Tinten, and J. Bialkowski, "Laser–solid interaction in the femtosecond time regime," Applied Surface Science, vol. 109, pp. 1-10, 1997. [14] E. W. Van Stryland et al., "Two photon absorption, nonlinear refraction, and optical limiting in semiconductors," Optical Engineering, vol. 24, no. 4, p. 244613, 1985. [15] D. Hutchings and E. W. Van Stryland, "Nondegenerate two-photon absorption in zinc blende semiconductors," JOSA B, vol. 9, no. 11, pp. 2065-2074, 1992. [16] K. Sokolowski-Tinten and D. von der Linde, "Generation of dense electron-hole plasmas in silicon," Physical Review B, vol. 61, no. 4, p. 2643, 2000. [17] H. M. Van Driel, "Kinetics of high-density plasmas generated in Si by 1.06-and 0.53-μm picosecond laser pulses," Physical Review B, vol. 35, no. 15, p. 8166, 1987. [18] D. Von der Linde, J. Kuhl, and H. Klingenberg, "Raman scattering from nonequilibrium LO phonons with picosecond resolution," Physical Review Letters, vol. 44, no. 23, p. 1505, 1980. [19] M. Ams, D. Little, and M. Withford, "Femtosecond-laser-induced refractive index modifications for photonic device processing," in Laser Growth and Processing of Photonic Devices: Elsevier, 2012, pp. 305-332. [20] D. Von der Linde and K. Sokolowski-Tinten, "The physical mechanisms of short-pulse laser ablation," Applied Surface Science, vol. 154, pp. 1-10, 2000. [21] C. Shank, R. Yen, and C. Hirlimann, "Fentosecond Time Resolved Surface Structural Dynamics of Optically Excited Silicon," MRS Online Proceedings Library (OPL), vol. 23, 1983. [22] P. Stampfli and K. Bennemann, "Time dependence of the laser-induced femtosecond lattice instability of Si and GaAs: Role of longitudinal optical distortions," Physical Review B, vol. 49, no. 11, p. 7299, 1994. [23] T. Glover, G. Ackerman, R. Lee, and D. Young, "Probing particle synthesis during femtosecond laser ablation: initial phase transition kinetics," Applied Physics B, vol. 78, no. 7, pp. 995-1000, 2004. [24] T. E. Glover, "Hydrodynamics of particle formation following femtosecond laser ablation," JOSA B, vol. 20, no. 1, pp. 125-131, 2003. [25] P. H. Bucksbaum and J. Bokor, "Rapid melting and regrowth velocities in silicon heated by ultraviolet picosecond laser pulses," Physical review letters, vol. 53, no. 2, p. 182, 1984. [26] P. Fauchet and A. Siegman, "Surface ripples on silicon and gallium arsenide under picosecond laser illumination," Applied Physics Letters, vol. 40, no. 9, pp. 824-826, 1982. [27] J. Sipe, J. F. Young, J. Preston, and H. Van Driel, "Laser-induced periodic surface structure. I. Theory," Physical Review B, vol. 27, no. 2, p. 1141, 1983. [28] L. L. Taylor, R. E. Scott, and J. Qiao, "Integrating two-temperature and classical heat accumulation models to predict femtosecond laser processing of silicon," Optical Materials Express, vol. 8, no. 3, pp. 648-658, 2018. [29] J. Thorstensen and S. Erik Foss, "Temperature dependent ablation threshold in silicon using ultrashort laser pulses," Journal of Applied Physics, vol. 112, no. 10, p. 103514, 2012. [30] J. Chen, D. Tzou, and J. Beraun, "Numerical investigation of ultrashort laser damage in semiconductors," International Journal of Heat and Mass Transfer, vol. 48, no. 3-4, pp. 501-509, 2005. [31] J. Krüger and W. Kautek, "Ultrashort pulse laser interaction with dielectrics and polymers," Polymers and Light, pp. 247-290, 2004. [32] J. Krüger and W. Kautek, "The femtosecond pulse laser: a new tool for micromachining," Laser physics, no. 9, 1, pp. 30-40, 1999. [33] J. Liu, "Simple technique for measurements of pulsed Gaussian-beam spot sizes," Optics letters, vol. 7, no. 5, pp. 196-198, 1982. [34] P.-T. Dong and J.-X. Cheng, "Pump–probe microscopy: theory, instrumentation, and applications," Spectroscopy, vol. 32, no. 4, pp. 2-11, 2017. [35] K. C. Phillips, H. H. Gandhi, E. Mazur, and S. Sundaram, "Ultrafast laser processing of materials: a review," Advances in Optics and Photonics, vol. 7, no. 4, pp. 684-712, 2015. [36] D. Strickland and G. Mourou, "Compression of amplified chirped optical pulses," Optics communications, vol. 55, no. 6, pp. 447-449, 1985. [37] Y. Izawa, S. Tokita, M. Fujita, M. Nakai, T. Norimatsu, and Y. Izawa, "Ultrathin amorphization of single-crystal silicon by ultraviolet femtosecond laser pulse irradiation," Journal of Applied Physics, vol. 105, no. 6, p. 064909, 2009. [38] D. Satoh et al., "Ultrafast pump-probe microscopic imaging of femtosecond laser-induced melting and ablation in single-crystalline silicon carbide," Applied Physics A, vol. 126, no. 10, pp. 1-8, 2020. [39] C. Florian et al., "Single Femtosecond Laser-Pulse-Induced Superficial Amorphization and Re-Crystallization of Silicon," Materials, vol. 14, no. 7, p. 1651, 2021. [40] T. Chiba, R. Komura, and A. Mori, "Formation of micropeak array on a silicon wafer," Japanese Journal of Applied Physics, vol. 39, no. 8R, p. 4803, 2000. [41] R. Moser, M. Domke, J. Winter, H. P. Huber, and G. Marowsky, "Single pulse femtosecond laser ablation of silicon–a comparison between experimental and simulated two-dimensional ablation profiles," Advanced Optical Technologies, vol. 7, no. 4, pp. 255-264, 2018. [42] S. Nolte et al., "Ablation of metals by ultrashort laser pulses," JOSA B, vol. 14, no. 10, pp. 2716-2722, 1997. [43] G. D. Tsibidis, M. Barberoglou, P. A. Loukakos, E. Stratakis, and C. Fotakis, "Dynamics of ripple formation on silicon surfaces by ultrashort laser pulses in subablation conditions," Physical Review B, vol. 86, no. 11, p. 115316, 2012. [44] A. Ferlauto et al., "Analytical model for the optical functions of amorphous semiconductors from the near-infrared to ultraviolet: Applications in thin film photovoltaics," Journal of Applied Physics, vol. 92, no. 5, pp. 2424-2436, 2002.
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