歷年來，磁性材料可應用之範疇相當廣泛，故了解其性質顯得更加重要。本論文以磁光柯爾效應為基礎，首先利用實驗室所架設的柯爾顯微鏡，擷取磁性材料表面上的原始影像以及磁區影像，及其原始對應之磁滯曲線。在這之後透過影像處理的方式，使用影像定位及偏移的技術，校正實驗中因載台或外界環境影響下的產生影像偏移誤差，來獲得更清楚的磁區影像，並且同時計算每張影像的灰階平均值，作為該影像當下磁場的磁矩大小，根據磁場-磁矩作圖而得到修正後整組影像的磁滯曲線。本研究在實驗過程中，使用不同材料作為待測樣品，在不同的磁性材料表面下，藉由影像偏移校正來測試程式的可行度。實驗結果顯示，藉由影像偏移校正確實能將影像上，因外界環境影像下的偏移而造成的缺陷所改善，而不影響到磁區的部分，同時也能夠獲得相對應的磁滯曲線。

Over the years, the range of applications of magnetic materials is quite wide, so it is more important to understand their properties. Based on the Magneto-Optical Kerr Effect, we first use the Kerr microscope which sets up in the laboratory to capture the original images and the magnetic domain images on the surface of the magnetic materials, and their original corresponding hysteresis loops. After that, through the image processing, we use image positioning and shifting technology to correct the image offset error caused by the stage or the external environment in the experiment to obtain a clearer magnetic domain image, and calculate the grayscale average value of each image at the same time as the magnitude of the magnetic moment of the current magnetic field of the image. Then according to the magnetic moment and the current magnetic field, we can obtain the corrected hysteresis loops of the images.
During the experiment, different materials are used as the samples. The feasibility of the program is tested by image shift correction at the surface of different magnetic materials. The experimental results show that the image shift correction can indeed improve the defects caused by the image offset caused by the external environment, without affecting the part of the magnetic domain, and also obtain the corresponding hysteresis loops.

摘要 i
Abstract ii
目錄 iii
圖目錄 vi
第一章 緒論 1
1.1 前言 1
1.2 研究動機與目的 1
第二章 原理與文獻回顧 2
2. 1 磁性物質 2
2.1.1 磁區 3
2.1.2 鐵磁性物質與磁滯現象 4
2.2 磁光柯爾效應 6
2.2.1 光的偏振 6
2.2.2 磁光柯爾效應原理 7
2.2.3 磁光柯爾效應訊號檢測 8
2.2.4 磁光柯爾效應之種類 10
2.2.5 磁光柯爾效應之模態 11
2.3 柯勒照明系統 11
2.4 文獻回顧 13
2.4.1 系統架構 13
2.4.2 樣品觀測結果 15
第三章 實驗架構與研究方法 17
3.1 系統架構 17
3.1.1 柯爾顯微鏡(Kerr Microscope) 17
3.2 影像處理程式系統 20
3.2.1 影像處理方式 20
3.2.2 影像定位程式 21
3.2.3 影像偏移校正及相減程式 22
3.3選用樣品及其特性 25
第四章 結果與討論 26
4.1 實驗操作流程 26
4.1.1 柯爾顯微鏡系統操作流程 26
4.1.2 影像偏移校正操作流程 26
4.2 影像定位 27
4.2.1 點區域定位 27
4.2.2 範圍區域定位 28
4.3 影像偏移校正 29
4.3.1 自動偏移校正 31
4.3.2 校正座標後自動偏移校正 34
4.3.3 手動輔助偏移校正 36
第五章 結論與未來展望 38
5.1 結論 38
5.2 未來展望 38
參考文獻 40

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