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[1] 林逸樵 (2013). “品質測試資料應用於保固產品之退貨率預測”, 國立清華大學統計學研究所碩士論文。 [2] Agresti, A., and Hitchcock, D. B. (2005). “Bayesian inference for categorical data analysis,” Statistical Methods and Applications, 14, 297-330. [3] Casella, G., and Berger, R.L. (1990). Statistical Inference, Wadsworth and Brooks/Cole, Pacific Grove, CA. [4] Hong, Y., and Meeker, W. Q. (2010). “Field-failure and warranty prediction based on auxiliary use-rate information,” Technometrics, 52, 148-159. [5] Meeker, W. Q. (1987). “Limited failure population life tests: application to integrated circuit reliability,” Technometrics, 29, 51-65. [6] Meeker, W. Q., Escobar, L. A., and Hong, Y. (2009). “Using accelerated life tests results to predict product field reliability,” Technometrics, 51, 146-161. [7] Suzuki, K. (1985). “Estimation of lifetime parameters from incomplete field data. Technometrics,” 27, 263-271. [8] Tseng, S. T., Hsu, N. J., and Lin Y. C. (2016). “Joint modeling of laboratory and field data with application to warranty prediction for highly reliable products." IIE Transactions, 48, 710-719.
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