半導體產業後段封裝測試廠，在最終測試製程，常常因為來料IC承載方式的不同，而需要不同種類的分類機，例如塑膠管子承載方式需要「自重式分類機」、塑膠盤承載方式需要「吸取擺放式分類機」、罐子承載方式需要「轉塔式式分類機」，其他承載方式需要客製化分類機。為了因應客戶不同來料承載方式，半導體後段封裝測試廠，需要投資採購不同款式的分類機，來符合客戶最終測試所需。
目前，半導體產業後段封裝測試設備，尚無一種分類機可以處理不同IC承載方式，本研究運用TRIZ系統化手法，針對一種彈性組合之分類機做功能分析，面對一些「矛盾(contradiction)」尋求找出解決方案，達成此彈性組合之分類機系統的功能需求。功能模組化與彈性組合:不受限進貨IC承載方式、增加機台使用率(utility)、加速設備可量產。可同時並行測試IC顆數不受機構限制: 影像感測IC同時並行測試數由4顆增加至32顆、單位時間產量最大化(每小時產出由480顆增加至3840顆)、減少額外投資(相同產能下節省台幣一億四千萬)、降低每顆IC測試成本約88%。不用更換模具(Change Kit):縮短量產架設時間(setup time)約94%、增加機台上線量產時間、增加稼動時間。

In the test process of semiconductor back-end process, due to different handling types of IC chips, different kinds of handler ports should be changed accordingly,For example: the plastic tube handling type needs“gravity type handler machine”,plastic tray handling type needs “pick and place type handler machine”, can handling type needs “turret type handler machine”, and other handling types need customized machines. To respond to customers with different handling types, semiconductor back-end equipment manufacturer, the focal company is oblighted to invest an equipment with a variety of different type handler ports, to meet the customers test requirements which can handle different IC handling types simultaneously in IC back-end IC testing. This research utilized the Top-TRIZ approach to develop an equipment that can flexibly combine different types of handler machine. By solving the contradictions of functional analysis, a machine that has functional modularity and flexible combination of various types of handlers is invented. The advantages of this equipment supports various IC handling types handling and, improves machine utility without extra investment. The performance of the testing equipment has increase throughput (UPH from 480 pcs to 3840 pcs)、increase parallesim test from 4 DUTs to 32 DUTs(for CIS device), and decrease unit cost:88%、decrease setup time:94%、save extra invest 140million NT dollors.

論文摘要 i
ABSTRACT ii
誌謝 iii
目錄 iv
圖目錄 vi
表目錄 viii
第一章 緒論 1
1.1 研究背景 1
1-2 研究動機 2
1-3 研究目的 3
1-4 論文架構 4
第二章 文獻回顧探討 6
2-1萃智(TRIZ) 6
2-1.1萃智(TRIZ)的理論基礎與工具 20
2-1.2物質-場分析 25
2-1.32-1.3 TOP(Tool-Object-Product)功能分析 32
2-2 三維層疊式積體電路(3D-SIC)測試概述 35
2-3彈性製造系統介紹(FLEXIBLE MANUFACTURING SYSTEMS , FMS) 36
第三章 研究方法 40
3-1 TRIZ解題步驟 40
3-1.1 創新性問題解決演算法(ARIZ) 42
3-2 使用TOP-TRIZ解決問題 50
3-3 TOP-TRIZ功能分析的案例說明 53
第四章 個案分析 57
4-1. 半導體產業鏈 57
4-1.1邏輯、混合信號、射頻積體電路最終測試產業 58
4-1.2最終測試業物料分類機需要考慮因素 59
4-1.3自動測試設備概述 61
4-2 個案背景 62
4-3彈性測試分類機介紹 64
4-4彈性測試分類機 TOP-TRIZ功能分析 68
4-4.1描述初始情況 68
4-4.2 分析情況 69
4-4.2.1功能分析與制定問題 69
4-5討論 74
第五章結論與建議 77
5-1 結論 77
5-2 研究限制 77
5-3 未來研究方向 78
參考文獻 79
附錄 84

英文部分
1. V.S. Sreebalaji and Dr. R. Saravanan，“TRIZ & UEDM”，The TRIZ Journal，2010.https://triz-journal.com/triz-ultrasonic-aided-electrical-discharge-machining/ viewed: 2/10/2017
2. James Kowalick，“Altshuller's Greatest Discovery - And Beyond”，The TRIZ Journal，1997. http://www.metodolog.ru/triz-journal/archives/1997/08/a/index.html viewed: 2/10/2017
3. Valeri Souchkov，“A Brief History of TRIZ”，The TRIZ Journal，2015.
https://triz-journal.com/a-brief-history-of-triz/ viewed: 2/10/2017
4. Janice Marconi，“ARIZ : The Algorithm for Inventive Problem Solving”，The TRIZ Journal，1998.
http://www.metodolog.ru/triz-journal/archives/1998/04/d/index.htm viewed: 2/10/2017
5. Darrell Mann & Simon Dewulf，“ Evolving The World's Systematic Creativity Methods”，The TRIZ Journal，2002.
https://triz-journal.com/evolving-worlds-systematic-creativity-methods/ viewed: 2/10/2017
6. Shuo-kai Tsai & Peter R.N. Childs，“The BRIGHT Process in Design”，The TRIZ Journal，2009.
https://triz-journal.com/triz-incorporating-the-bright-process-in-design/ viewed: 2/10/2017
7. Kalevi Rantanen，“Levels of Solutions”，The TRIZ Journal，1997.
http://www.metodolog.ru/triz-journal/archives/1997/12/d/index.htm viewed: 2/10/2017
8. Denis CAVALLUCCI and Philippe LUTZ，“Beyond TRIZ Limits”，The TRIZ Journal，1998.
http://www.metodolog.ru/triz-journal/archives/1998/03/d/index.htm viewed: 2/10/2017
9. Iouri Belski，“Solving Problems With Method of the Ideal Result”，The TRIZ Journal，1999.
https://triz-journal.com/solving-problems-method-ideal-result/ viewed: 2/10/2017
10. John Terninko，“Su-Field Analysis”，The TRIZ Journal，2000.
https://triz-journal.com/su-field-analysis/ viewed: 2/10/2017
11. Vladimir Petrov，“A New Approach to Su-Field: Structural Analysis”，The TRIZ Journal，2015.
https://triz-journal.com/a-new-approach-to-su-field-structural-analysis/ viewed: 2/10/2017
12. Vladimir Petrov， “Su-Field Analysis for Information Processing System”，The TRIZ Journal，2015.
https://triz-journal.com/su-field-analysis-for-infomation-processing-system/ viewed: 2/10/2017
13. Janice Marconi，“ARIZ : The Algorithm for Inventive Problem Solving”， The TRIZ Journal，1998.
http://www.metodolog.ru/triz-journal/archives/1998/04/d/index.htm viewed: 2/10/2017

14. Vladimir Petrov，“Logic of ARIZ”， The TRIZ Journal，2005.
https://triz-journal.com/logic-ariz/ viewed: 2/10/2017
15. Valery Krasnoslobodtsev， Richard Langevin，“Applied TRIZ In High-Tech Industry”，The TRIZ Journal，2006. https://triz-journal.com/applied-triz-high-tech-industry/ viewed: 2/10/2017
16. Vladimir Petrov ，“ALGORITHM FOR SELECTING TRIZ TOOLS ”，The TRIZ Journal，2016. https://triz-journal.com/algorithm-for-selecting-triz-tools/ viewed: 2/10/2017
17. Zinovy Royzen ，“Tool， Object， Product (TOP) Function Analysis”，The TRIZ Journal，1999. http://www.metodolog.ru/triz-journal/archives/1999/09/d/index.htm viewed: 2/10/2017
18. Val Kraev，“Inventive Standards & S-Field Models - Lesson 8”，The TRIZ Journal，2007. http://www.metodolog.ru/triz-journal/archives/2007/05/06/index.html viewed: 2/10/2017
19. Valeri Souchkov，“The 5 Levels of Solutions Explained”，The TRIZ Journal，2007. https://triz-journal.com/differentiating-among-the-five-levels-of-solutions/ viewed: 2/10/2017
20. M. P. Groover(2001)，“Automation, Production, and Computer-Integrated Manufacturing ”，Prentice-Hall International, Inc.,

中文部分

1. 許棟樑(2015)，萃智創新工具精通:上冊(四版)，亞卓國際顧問股份公司。
2. 許棟樑(2013)，萃智創新工具精通:中冊，亞卓國際顧問股份公司。
3. 蕭吟今(2007)，TRIZ創意40錦囊妙計，建速個人工作室。
4. 蕭吟今(2006)，創意快閃-TRIZ大思維，建速個人工作室。
5. 孫韻翔(2016)，「物質-功能-屬性模型和參數操作法解物理衝突」，清華大學，碩士論文。
6. 蔡孟宇(2016)，「使用萃智工具與層級分析法改善面板廠Cell Test製程良率與庫存」， 清華大學，碩士論文。

網路資源
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viewed: 2/10/2017
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