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作者(中文):謝佾穎
作者(外文):Hsieh, Yi-Ying
論文名稱(中文):韋伯壽命分配在型二右設限樣本下之產品驗收判定機制
論文名稱(外文):A Product Acceptance Determination Approach for Weibull Lifetime Products under Type II Right Censored Samples
指導教授(中文):吳建瑋
指導教授(外文):Wu, Chien-Wei
口試委員(中文):張國浩
蘇明鴻
學位類別:碩士
校院名稱:國立清華大學
系所名稱:工業工程與工程管理學系
學號:104034543
出版年(民國):107
畢業學年度:106
語文別:中文
論文頁數:61
中文關鍵詞:壽命檢定計畫壽命績效指標韋伯分配型二右設限樣本重複群集驗收計畫
外文關鍵詞:Lifetime sampling planLifetime performance indexLifetime testWeibull distibutionType II right censored dataRepetitive group sampling plan
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在競爭激烈的產品市場中,產品品質為一間公司的能否獲得顧客認同的關鍵因素,而針對現代常見的電子產品,其品質衡量的標準為產品的壽命長度。而為了確認產品品質是否達到標準,驗收抽樣計畫則予以實施,在保障買賣雙方的品質水準要求與能夠承受的風險條件下,利用相較少數的時間對眾多貨批做出判決。除此之外,也由於電子產品壽命通常服從非常態之分配,而現階段的抽樣計畫所使用的製程能力指標需要產品品質特性服從常態之假設,因此本研究利用了壽命績效指標來衡量產品壽命之表現。另外,在蒐集壽命資料的時候,若要觀測完全部的樣本需要相當長的時間,所以設限資料因而興起,而為了有效地衡量電子產品之壽命,我們將針對壽命服從韋伯分配之產品,在型二右設限資料的樣本形式下,以壽命績效指標之一致最小方差不偏估計量,發展兩種不同的壽命檢定計畫:單次壽命檢定計畫及重複群集壽命檢定計畫,並提供兩種檢定計畫參數表給業者使用,讓他們可以根據不同的品質水準及風險查詢所需抽樣數及允收臨界值。本研究亦針對兩種不同的檢定計畫做比較與分析,並且說明兩種計畫的優缺點以及使用情境,並舉一個真實案例以闡明兩種計畫之使用方式。此外,本研究也建構一個操作平台包含上述兩種抽樣計畫,讓使用者可憑藉該平台進行數據分析與貨批判斷。
In this competitive market which is filled with various products, the quality of an item become the critical factor for consumers. For electronic products, lifetime is the best index to describe how good is the quality. Besides, in order to measure the lot quality, acceptance sampling plan is implemented. With acceptance sampling plan, testers can make an acceptance or rejection decision in a short time. Moreover, since the lifetime of electronic products usually follows a non-normal distribution, we focus on Weibull distribution in this research. In addition, because it is not practical to observe all the lifetime data from a lot, type II right censored data are used to develop an acceptance sampling plan. This research aims at developing two kinds of life-test sampling plan: single sampling plan and repetitive group sampling plan, for Weibull distributed product. This research not only solves the mathematical model under different parameter conditions but also tabulate the outcomes for future use. With the tables, users can look up the sample size and critical value they need easily. In addition, we provide two examples for two different lifetime sampling plans, to illustrate the process of the sampling plans. In the end, we develop an operating platform which users can use to analyze data and sentence the lot.
致謝 i
摘要 ii
Abstract iii
目錄 iv
圖目錄 vi
表目錄 vii
第一章 緒論 1
1.1 研究背景與動機 1
1.2 研究目的與方法 2
1.3 研究架構 3
第二章 文獻回顧與探討 6
2.1 驗收抽樣計畫 6
2.1.1 計數型與計量型抽樣計畫 7
2.1.2 驗收抽樣計畫之方式 8
2.1.3 驗收抽樣計畫之績效衡量 11
2.2 製程能力指標 14
2.3 壽命績效指標 16
2.4 產品壽命資料適用之分配 17
2.4.1 韋伯分配 18
2.4.2 壽命資料的其他分配 20
2.5 壽命試驗及樣本資料型態 21
2.5.1 設限樣本 21
2.5.2 型二右設限樣本 23
2.6 韋伯分配下之壽命績效指標 24
2.6.1 韋伯分配壽命資料之壽命績效指標 24
2.6.2 產品壽命績效指標與產品良率間的關係 25
第三章 韋伯產品壽命的型二右設限樣本資料之單次壽命檢定計畫 26
3.1 型二右設限樣本資料之壽命績效指標估計式 26
3.2 型二右設限樣本資料之單次壽命檢定計畫 29
3.2.1 單次抽樣檢定計畫 29
3.2.2 產品貨批的允收機率 31
3.2.3 單次壽命檢定計畫參數之數學模型 32
3.2.4 數學模型之求解與結果分析 33
3.3 單次壽命檢定程序 36
3.4 案例分析 37
第四章 韋伯產品壽命的型二右設限樣本資料之重複群集壽命檢定計畫 42
4.1 重複群集抽樣計畫設計設計概念與操作流程 42
4.2 型二右設限樣本之重複群集壽命檢定計畫 44
4.2.1 產品貨批之允收機率 44
4.2.2 重複群集壽命檢定計畫參數之數學模型 45
4.2.3 數學模型之求解與結果分析 46
4.3 重複群集壽命檢定程序 50
4.4 案例分析 50
第五章 結論與未來研究 55
5.1 結論 55
5.2 未來研究方向 56
參考文獻 58

一、 中文文獻
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2.林良憲(民97),〈利用型II多重設限樣本對具有Weibull分配的產品之壽命性能指標做統計推論〉。嘉義大學應用數學系碩士論文。
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