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[1] L. Rizzatti, “Digital Data Storage is Undergoing Mind Boggling Growth,” EE Times http://www.eetimes.com/author.asp?section_id=36&doc_id=1330462. [2] IDC, “The Digital Universe of Opportunities: Rich Data and the Increasing Value of the Internet of Things,” Apr. 2014. [3] Micron Technology, Micron and Industry Analyst, 2016 http://files.shareholder.com/downloads/ABEA-45YXOQ/0x0x875021/4BEAA02E-BBC2-402C-A51D-B3B2C6B8C3D4/Winter_Analyst_Day_2016.pdf. [4] A. Shehabi, S. Smith, D. Sartor, R. Brown, M. Herrlin, J. Koomey, E. Masanet, N. Horner, I. Azevedo, W. Lintner, “United States Data Center Energy Usage Report,” Jun. 2016 https://eta.lbl.gov/sites/all/files/publications/lbnl-1005775_v2.pdf. [5] Statista, "Global smartphone shipments forecast from 2010 to 2020," https://www.statista.com/statistics/263441/global-smartphone-shipments-forecast/. [6] Statista, "Forecast unit shipments of tablets worldwide from 2010 to 2020," https://www.statista.com/statistics/269912/worldwide-tablet-shipments-forecast/. [7] Ericsson, “CEO to shareholders: 50 billion connections 2020,” https://www.ericsson.com/thecompany/press/releases/2010/04/1403231. [8] Cisco, "The internet of things: how the next evolution of the internet is changing everything," https://www.cisco.com/c/dam/en_us/about/ac79/docs/innov/IoT_IBSG_0411FINAL.pdf [9] C.-W. Wu, B.-Y. Lin, H.-W. Hung, S.-M. Tseng and C. Chen, “Symbiotic System Models for Efficient IOT System Design and Test,” in Proc. IEEE International Test Conference in Asia (ITC-Asia), Sept. 2017 (to appear). [10] A. Nordrum, "The internet of fewer things," IEEE Spectrum, pp. 12–13, Oct. 2016. [11] H.-W. Hung, Peer-Assisted Repair Mechanism for Reliable and Cost-Effective IOT Systems, MS Thesis, National Tsing Hua University, Hsinchu, Taiwan, Jun. 2017. [12] B. Schroeder, E. Pinheiro, and W.-D. Weber, “DRAM Errors in the Wild: A Large-Scale Field Study,” in Proc. SIGMETRICS ’09, pp. 193-204, 2009. [13] J. Meza, Q. Wu, S. Kumar and O. Mutlu, “A large-Scale Study of Flash Memory Failures in the Field,” in Proc. SIGMETRICS ‘15, vol. 43, no. 1, pp. 177-190, Jun. 2015. [14] J. Meza, Q. Wu, S. Kumar, O. Mutlu, “Revisiting Memory Errors in Large-Scale Production Data Centers: Analysis and Modeling of New Trends from the Field,” in Proc. IEEE/IFIP Int. Conf. Dependable Systems and Networks (DSN), 2015.
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